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Our research requires fast, precise, and reliable characterization of thousands of photonic devices on integrated photonics devices (silicon-on-insulator, Silicon Nitride, thin-film lithium niobate chips), a scale far beyond what conventional measurement setups can handle.
To meet this challenge, we developed a fully automated characterization platform that integrates piezoelectric actuators, Arduino-based control electronics, and a proprietary measurement algorithm specifically tailored for high-throughput testing.
This system enables unprecedented measurement speed, stability, and repeatability, allowing us to rapidly collect large-scale statistical data essential for device optimization, yield analysis, and robust photonic design.
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